Vadim Pinskiy is Vice President of Research and Development at Nanotronics. He oversees product development, R&D, and the development of AI platforms. Vadim got his Ph.D. in neurobiology, focusing on mouse neuroanatomy using high-throughput imaging and advanced tracing techniques.
Nanotronics is a science and technology company that has reinvented factory management by inventing a platform that combines artificial intelligence, automation, and sophisticated visualisation to aid human ingenuity in detecting defects and anomalies in manufacturing, an industry that has been stagnant since the 1950s. We work with cutting-edge companies-from aerospace to electronics to healthcare-to increase productivity, reduce floor space and waste, lower costs and accelerate design iteration.
Vadim Pinskiy previously completed an MSc in Biomedical Engineering at Cornell University and a BSc and MSc in Electrical Engineering and Biomedical Engineering at Stevens Institute of Technology. Vadim is very interested in using advanced techniques and artificial intelligence systems to solve problems in biology and manufacturing.
Inventor Vadim Pinskiy’s patents
In 2020, Vadim Pinskiy applied for patents to protect the inventions. This list consists of the patent applications (pending) and patents that have already been granted by the USPTO.
Systems, Methods, and Environments for Manufacturing Processes
A production system is disclosed here. The production system comprises one or more stations, a control module, and a monitoring platform. Each station is configured to perform at minimum one step of the manufacturing process. The monitoring platform is created to monitor the progress throughout the multi-step manufacturing. Controls are configured to dynamically adjust the parameters of each step in the manufacturing process, which helps to achieve the desired quality of the final product.
Systems, devices, improving the super-resolution images, methods for providing feedback
In some embodiments, an image with a low-resolution may be created using a low-resolution lens of a microscopic inspection system. An over-resolution image of a portion of the sample can be generated from the low-resolution sample image using an over-resolution image simulation. Subsequently, an estimate of the accuracy of the super-resolution image may be identified based on the degree of equivalence between the image and one or more scanned high-resolution images of at least a portion of one or more related samples using a classifier of simulated image.
Automatic microscope focusing systems, devices, and techniques
An automatic focusing for microscope, which facilitates faster focusing by means of at least two offset focusing chambers. Each offset focusing camera may be positioned on the other side of the image-forming conjugate plane so that the sharpness curves intersect in the image-forming plane. The focus of the sample can be adjusted with the sharpness values from the images taken by the focusing cameras.